Contact terminal height measuring device
Terminal height measurement device Hightron
The measurement time is less than one second due to simultaneous measurement of all points in the target area. Data can be obtained without being affected by the material, surface condition, gloss, etc., of the target surface. A patent is currently pending. It was also featured in the Nihon Keizai Shimbun (April 15, 2005). It received the Excellence Award at the Kanagawa Business Audition 2005.
